NXI-6500/6501
NXI Temperature Modules
Precise NXI temperature modules for TC & RTD with 1500V isolation for HV tests.
The NXI temperature acquisition modules include specialized solutions for thermocouples (TC) and resistance temperature detectors (RTD). Models NXI-6500 and NXI-6501 provide 16 channels for thermocouple types K, J, E, S, T, R, and N with a measurement accuracy of up to 0.5°C. For resistance-based measurements, the NXI-6510 offers eight parallel channels for PT100 and PT1000 sensors in 2-, 3-, or 4-wire configurations. These modules achieve sampling rates of up to 100 S/s per channel with a resolution of up to 24 bits. A key feature of the HV variants is the high isolation voltage of 1500V DC to ground, enabling safe operation in battery testing environments. Power is supplied via 12V DC, while communication is established through LAN or CAN using Modbus-RTU, SCPI, or CANopen protocols. Typical applications are found in the automotive industry, aerospace, and industrial process monitoring.
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Description
NXI-6510-8 RTD temperature acquisition module, 8 channels, PT100/PT1000, 24-bit, 100 S/s, LAN/CAN
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Technical Data
NXI Category
Meas. & DAQ Modules
Product category
NXI Measurement & Test Systems
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Description
NXI-6500-16 Thermocouple temperature acquisition module, 16 channels, ±0.5 °C, 0.02 °C resolution, 10 S/s
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Technical Data
NXI Category
Meas. & DAQ Modules
Product category
NXI Measurement & Test Systems
|
Description
NXI-6501-16 Thermocouple temperature acquisition module, 16 channels, 24-bit, ±0.5 °C, 100 S/s, LAN/CAN
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Technical Data
NXI Category
Meas. & DAQ Modules
Product category
NXI Measurement & Test Systems
NXI-6501-16: High-Precision 16-Channel Thermocouple Temperature Acquisition Module for Industrial Test Technology
The NXI-6501-16 is a modular high-performance instrument for parallel acquisition of temperature data across 16 independent channels. With 24-bit resolution, integrated cold-junction compensation, and robust galvanic isolation, the module is ideal for precise temperature measurements in automated test systems, research facilities, and industrial testing environments.
The fully parallel architecture enables synchronous measurement without the time offsets typical of multiplexing systems. This allows thermal processes to be monitored precisely and reproducibly even under dynamic load conditions, including in electromagnetically stressed high-voltage environments.
Key User Benefits
Typical Applications
Monitoring cell and module temperatures during charge, discharge, and fast-charge cycles in HV environments.
Thermal qualification of avionics components and subsystems under stringent safety and precision requirements.
Analysis of thermal durability during overload tests, long-term investigations, and quality-critical test sequences.
Validation of thermal robustness of control units in climate chambers, test stands, and realistic test environments.
