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Description
NXI-6400-1000/10

Description
NXI-6400-1000/10 DC voltage and current measurement module, ±1000 V, up to 10 A, 6½ digit, 2500 readings/s
NXI-6400-1000/10
NXI-6400-1000/10 DC voltage and current measurement module, ±1000 V, up to 10 A, 6½ digit, 2500 readings/s
NXI Module Card

Technical Data

NXI Category

Meas. & DAQ Modules

Product category

NXI Measurement & Test Systems

Precision DC Measurement Module NXI-6400-1000-10: 6.5-Digit Accuracy for Highly Automated Industrial Test Systems

The NXI-6400-1000-10 was developed as a high-precision DC measurement module to bring the performance of a benchtop 6.5-digit multimeter into a compact, modular test environment. It enables precise DC current measurements down to the nA range while simultaneously measuring voltages up to 1000 V.

By combining laboratory-grade accuracy, high measurement speed, and a single-slot architecture, the module is ideally suited for automated test systems in research, development, and production. Integration into the NXI ecosystem creates a scalable, space-saving platform for demanding precision measurement tasks.

Key User Benefits

6.5D
6.5-Digit Precision
Maximum resolution for detecting even the smallest signal deviations during the characterization of demanding electronic devices.
2500/s
High Measurement Rate
Up to 2500 readings per second reduce test cycle time and capture fast transient events.
1µA-10A
Wide Current Measurement Range
From microamps to 10 A in a single module – ideal for leakage current, quiescent current, and load current measurements.
nA
Accurate Low-Current Measurement
Especially suitable for the analysis of low-power semiconductors and efficient battery components.
20mm
Extremely Compact Design
The single-slot design with only 20 mm width enables very high channel density in the NXI system.
SCPI
Industry-Compatible Integration
SCPI and Modbus simplify integration into ATE systems, PLC environments, and automated test processes.

Typical Application Areas

ECU
Automotive Electronics

Precise quiescent current measurement on control units and electronic assemblies in automotive environments.

3C
Consumer Electronics

Validation of standby times, charge states, and energy efficiency in smartphones, wearables, and mobile devices.

SEM
Semiconductor Testing

Characterization of wafers and components with regard to leakage currents and precise electrical parameters.

R&D
Research and Education

Automated test sequences with consistently high measurement accuracy for scientific and industrial development.

Functional and System Description

NXI
Seamless Chassis Integration
As a single-slot module, the device can be integrated into an NXI-F1000 chassis and expanded into high-channel-count ATE systems.
LAN
Direct Standalone Operation
No proprietary controller required – the module can be controlled and commissioned directly via LAN.
RJ45
Simple Network Connectivity
The LAN interface via RJ45 supports distributed test benches, remote maintenance, and centralized system monitoring.
MOD
SCPI / Modbus Protocols
Open communication standards ensure fast integration into test software and industrial control systems.
4PIN
Industrial-Grade Connectivity
4-pin banana jacks enable robust and reproducible signal routing within the test system.
PULL
Fast Module Replacement
The integrated extraction handle simplifies service, maintenance, and replacement in rack systems.

Technical Key Data

Parameter Specification
Resolution 6.5 digits
Measurement Rate Up to 2500 readings/s
DC Voltage Measurement Range Up to ±1000 V
DC Current Measurement Range 1 µA to 10 A
Voltage Accuracy Depending on range, up to 0.0030 % of reading + 0.0004 % of range
Current Accuracy Depending on range, from 0.050 % of reading + 0.001 % of range
Interfaces LAN (RJ45)
Communication SCPI / Modbus
Supply 12 VDC ±10 %, < 0.5 A
Mechanical Dimensions (H × W × D) 130.5 mm × 20 mm × 230.5 mm incl. extraction handle
Operating Environment 0 °C to 40 °C; up to 2000 m altitude

DCV Specifications

Range 1-Year Accuracy (± % of reading + % of range) Temp. Coefficient / °C
±100 mV 0.0050 + 0.0035 0.0002 + 0.0005
±1 V 0.0035 + 0.0004 0.0002 + 0.0001
±10 V 0.0030 + 0.0004 0.0002 + 0.0001
±100 V 0.0040 + 0.0006 0.0002 + 0.0001
±1000 V 0.0040 + 0.0006 0.0002 + 0.0001

DCI Specifications

Range 1-Year Accuracy (± % of reading + % of range) Temp. Coefficient / °C
1 µA 0.050 + 0.005 0.0020 + 0.0010
10 µA 0.050 + 0.002 0.0015 + 0.0006
100 µA 0.050 + 0.001 0.0015 + 0.0004
1 mA 0.050 + 0.005 0.0015 + 0.0005
10 mA 0.050 + 0.020 0.0020 + 0.0020
100 mA 0.050 + 0.005 0.0020 + 0.0005
1 A 0.080 + 0.010 0.0050 + 0.0010
3 A 0.200 + 0.020 0.0050 + 0.0020
10 A 0.120 + 0.010 0.0050 + 0.0010

Variants and Configuration Options

1S
Single-Slot Module

Extremely compact form factor for high-channel-count precision measurement systems with minimal rack space requirements.

NXI
Scalable NXI Platform

Ideal for modular test architectures that need to be flexibly expanded as requirements grow.

LAB
Laboratory and Production

Suitable for both cost-sensitive laboratory workstations and industrialized ATE environments.

RANGE
Wide Measurement Coverage

One module for low-current analysis and load current measurement reduces the need for external devices, shunts, and wiring errors.

Integration and Automation

SCPI
Fast Script Integration
The SCPI command set simplifies the development of automated test sequences in existing software environments.
PLC
Direct PLC Connectivity
Native Modbus support enables smooth integration into OT and manufacturing processes.
ATE
Ideal for ATE Systems
High precision and high measurement speed make the module a key component of modern automated test infrastructures.
DATA
Near Real-Time Data Availability
Measurement data can be provided directly for analysis, limit monitoring, and process decisions.
LAN
Distributed Test Benches
The LAN-based architecture supports centralized monitoring and flexible integration of multiple measurement points.
CoT
Reduced Cost of Test
Combining multiple current ranges in a single module significantly reduces hardware effort and potential sources of error.

Strategic Value for Industrial Users

The NXI-6400-1000-10 combines high precision, fast data acquisition, and compact system integration in a single module. This makes it possible to reliably characterize future generations of ultra-low-power electronics as well as classic industrial load profiles in the ampere range.

Choosing the NXI platform creates long-term process stability and scalability. As channel requirements grow, the system can be expanded flexibly without rebuilding the existing test architecture. This makes the module a future-proof investment for research, development, and production testing.

Consultation and Contact

Not sure whether this product is the right fit for your application? We will be happy to support you in selecting the right solution for your requirements – from a single application to complete system integration. Contact us conveniently via live chat, contact form, email, or phone – we provide personal, practical advice tailored to your needs. Depending on availability, we can also provide a free demo unit for evaluation in your test environment so that you can test the system directly under real operating conditions.

Get in touch with us

+49 (0) 6205 - 3948-0 info@et-system.de

Mon - Thu: 8:00 AM - 5:00 PM
Fri: 8:00 AM - 3:00 PM

Contact Us Directly

+49 (0) 6205 - 3948-0 info@et-system.de

Mo - Do von 8 - 17 Uhr
Fr von 8 - 15 Uhr

Contact Us Directly