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NXI-6110-8

Description
NXI-6110-8 High-accuracy analog input module, 8 channels, ±60 V, optional up to 2000 V / ±1000 A, 100 kS/s
NXI-6110-8
NXI-6110-8 High-accuracy analog input module, 8 channels, ±60 V, optional up to 2000 V / ±1000 A, 100 kS/s
NXI Module Card

Technical Data

NXI Category

Meas. & DAQ Modules

Product category

NXI Measurement & Test Systems

NXI-6110-8: Precision Analog Input Module for Highly Dynamic Data Acquisition in Modern Test Environments

The NXI-6110-8 is a powerful 8-channel data acquisition module designed for the precise capture of fast analog signals in research, development, and industrial test engineering. With a sampling rate of 100kS/s per channel and a wide voltage range up to ±60V, the module is ideally suited for dynamic measurement tasks under demanding electrical conditions.

By combining high sampling speed, galvanically isolated channels, and high voltage withstand capability, transient processes in complex systems can be recorded completely, safely, and reproducibly.

This makes the NXI-6110-8 a reliable foundation for precise analysis in high-voltage, HIL, and automated test environments.

Key Advantages

8
8 Galvanically Isolated Analog Inputs
Parallel acquisition of multiple signal sources while reliably preventing ground loops and mutual signal interference.
High Isolation Strength
Up to 1500V DC between channel and ground as well as 300V DC between channels for maximum operational safety and reliable user protection.
High Measurement Accuracy
Precision down to 0.2mV in the ±200mV range for detecting even the smallest signal changes in highly accurate test sequences.
±V
Flexible Measurement Ranges
Scalable voltage ranges from ±200mV to ±60V for direct connection of a wide variety of sensors and signal sources.
100kS/s per Channel
Total sampling rate of 800kS/s for simultaneous and seamless acquisition of fast events across all channels.
HV
Expandable for HV and Current Measurement
Optional accessories enable measurement applications up to 2000V and, in combination with current sensors, up to ±1000A.

Typical Applications

The NXI-6110-8 is designed for demanding measurement tasks where high dynamics, electrical isolation, and reproducible multi-channel data acquisition are essential.

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High-Voltage Battery Testing

Precise monitoring of voltage curves and load changes in traction batteries, energy storage systems, and HV systems.

PV Inverter Testing

Analysis of signal quality, dynamics, and efficiency under transient load and operating conditions.

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HIL Test Systems

Highly accurate real-time feedback of analog measured values for hardware-in-the-loop applications and control loop validation.

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Integrated Test Bench Solutions

Central data acquisition in automated manufacturing, validation, and quality assurance environments.

Power Electronics Development

Acquisition of fast transient signals in converters, inverters, DC systems, and dynamic R&D scenarios.

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Correlation and Phase Analysis

Synchronized multi-channel measurement for accurate analysis of timing relationships in complex systems.

Technical Highlights

Measurement Ranges ±60V, ±10V, ±6V, ±1V, and ±200mV
Resolution down to 10µV in the smallest measurement range
Accuracy 0.05 % to 0.1 % depending on configuration and measurement range
Sampling Rate 100kS/s per channel, 800kS/s total rate
Isolation 1500V DC channel-to-ground, 300V DC channel-to-channel
Input Impedance range-dependent from greater than 1MΩ to greater than 100MΩ

Functional Concept and Data Acquisition

The NXI-6110-8 was developed for maximum data consistency and reliable acquisition of fast signal curves. An integrated memory of 4MB per channel ensures that no relevant transients are lost even at high sampling rates.

Channel Memory 4MB per channel for reliable recording of fast measurement events
Synchronous Acquisition Multi-channel trigger function for time-aligned measurements
Phase Analysis Suitable for precise correlation and phase measurements in complex systems
Clock Sources Selectable internal or external clock source
Signal Integrity Designed for precise acquisition of highly dynamic analog signals
Multi-Channel Performance Simultaneous documentation of critical events across all inputs

Variants and Modular Expansion

The modularity of the NXI-6110-8 significantly expands its range of applications through external accessories and additional sensors.

NXI-6110-DV Optional high-voltage divider for voltage measurements up to 2000V
Current Sensor Integration Extension for current measurements up to ±1000A
Active Power Determination Up to 2MW feasible in combination with external sensors
Modularity Adaptable to growing test requirements in energy and automotive engineering
Single-Slot Design Optimized for high channel density in the NXI-F1000 chassis
Standalone Operation Can also be used independently depending on system architecture

Integration and Automation

For use in automated test equipment and HIL environments, the NXI-6110-8 features standardized interfaces such as LAN and CAN. This allows the module to be easily integrated into existing test and control structures.

An adjustable data update interval of 1ms to 10s enables precise adaptation to different control loops and data requirements in test software.

Thanks to its compact single-slot form factor, the module is particularly suitable for applications with high channel density and limited space in control cabinets or test racks.

Operational Safety and Long-Term Stability

The NXI-6110-8 offers not only high measurement performance but also excellent stability for continuous industrial operation. A low temperature coefficient of 30ppm/°C supports consistent measurement results even under changing environmental conditions.

In addition, high common-mode rejection ensures that external electromagnetic influences do not significantly impair signal quality. This improves reproducibility and increases the reliability of measurement results in harsh test bench environments.

Strategic Added Value

The NXI-6110-8 combines high sampling rate, wide voltage ranges, galvanic isolation, and modular expandability in a compact analog input module for modern test systems.

This creates a future-proof platform for precise data acquisition in high-voltage, HIL, and industrial test applications that can be used reliably in both development and series environments.

Consulting and Contact

Not sure whether this product is the ideal fit for your application? We are happy to support you in selecting the right solution for your requirements – from a standalone application to complete system integration.

You can easily contact us via live chat, the contact form, email, or phone – we provide personal and practical advice tailored to your application.

Depending on availability, we can also provide a free demo unit for evaluation in your test environment so that you can test the system directly under real operating conditions.

Get in touch with us

+49 (0) 6205 - 3948-0 info@et-system.de

Mon - Thu: 8:00 AM - 5:00 PM
Fri: 8:00 AM - 3:00 PM

Contact Us Directly

+49 (0) 6205 - 3948-0 info@et-system.de

Mo - Do von 8 - 17 Uhr
Fr von 8 - 15 Uhr

Contact Us Directly