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Description
NXI-6100-32/12

Description
NXI-6100-32/12 High-speed data acquisition module, 32 AI, 2 AO, 12-bit, 1.25 MS/s input, 1 MS/s output
NXI-6100-32/12
NXI-6100-32/12 High-speed data acquisition module, 32 AI, 2 AO, 12-bit, 1.25 MS/s input, 1 MS/s output
NXI Module Card

Technical Data

NXI Category

Meas. & DAQ Modules

Product category

NXI Measurement & Test Systems

NXI-6100-32/12 – High-Speed Data Acquisition Module for Precise Multi-Channel Measurements

The NXI-6100-32/12 is a powerful high-speed data acquisition module for industrial test systems and research applications. With up to 32 analog input channels and a total sampling rate of 1.25 MS/s, the module enables highly accurate real-time monitoring of complex electrical signals.

The combination of high channel density, fast data acquisition, and integrated analog outputs makes the module ideal for modern test benches, automated test systems, and laboratory environments. Thanks to the modular NXI architecture, the system can be scaled flexibly and integrated easily into existing measurement and automation environments.

This creates a powerful platform for applications where high acquisition speed, precise signal resolution, and compact system integration are critical.

Key Advantages

32CH
High Channel Density
Up to 32 single-ended or 16 differential inputs enable extensive signal monitoring while minimizing rack space requirements.
12BIT
Precise Signal Resolution
The 12-bit resolution allows precise measurement of even small voltage changes in the millivolt range.
1.25M
High-Speed Sampling Rate
With a total sampling rate of up to 1.25 MS/s, fast signal transitions and transient events can be captured accurately.
AO
Integrated Analog Outputs
Two analog outputs with high slew rate enable the simulation of dynamic sensor signals and test profiles.
FIFO
16 MB Data Memory
A powerful FIFO acquisition buffer ensures that no measurement data is lost even at maximum data rates.
LAN
Flexible Network Integration
LAN-based communication enables easy integration into networked test systems and decentralized measurement architectures.

Typical Applications

The NXI-6100-32/12 is suitable for industrial and scientific applications where many channels, high-speed sampling, and precise signal analysis are required at the same time.

3C
3C Consumer Electronics

High-speed testing of electronic assemblies and battery management systems.

IND
Industrial Control Systems

Real-time monitoring and analysis of control and sensor signals in automated production environments.

R&D
Research and Development

Flexible signal acquisition and analysis for laboratory environments with changing measurement requirements.

TEST
Automated Test Systems

Integration into modular ATE systems for precise data acquisition and signal processing.

LAB
Laboratory and Validation Environments

Suitable for precise signal observation, transient analysis, and functional validation of electronic systems.

ATE
Production-Oriented Test Automation

High channel count and fast data processing support standardized test procedures in production and quality assurance.

Functional Concept and System Architecture

The module supports both single-ended and differential measurements, making it flexible for a wide range of signal sources and EMC requirements.

SE
Single-Ended Inputs
Up to 32 channels provide maximum measurement density for applications with numerous signal sources.
DIFF
Differential Measurement
16 differential channels reduce interference and enable precise measurements in EMI-sensitive environments.
EMI
Interference-Resistant Measurement
Differential signal routing minimizes common-mode interference and improves signal integrity.
BUF
Large Data Buffer
The integrated 16 MB FIFO buffer ensures stable data acquisition even at high sampling rates.
WAVE
User-Defined Waveforms
An internal cache enables the output of complex signal profiles directly from the hardware.
SYS
Modular NXI System Integration
Flexible integration into NXI chassis enables scalable measurement systems with high channel density.

Technical Key Data

Input Channels 32 single-ended or 16 differential
Resolution 12 bit
Input Ranges ±10 V / ±5 V / ±1 V / ±200 mV
Input Sampling Rate Up to 1.25 MS/s
Output Sampling Rate Up to 1 MS/s
Input Impedance 10 GΩ
Analog Outputs 2 channels
Memory 16 MB FIFO
Interfaces LAN
Connection 50-pin MDR
Form Factor Single-slot module
Dimensions 130.5 mm × 20 mm × 230.5 mm

Integration and Automation

The NXI-6100-32/12 was developed for integration into automated test systems and networked measurement environments. LAN-based communication simplifies remote control and integration into existing IT and test infrastructures.

ATE
Optimized for ATE Systems
Ideal for automated test systems with high channel counts and fast measurement requirements.
NXI
NXI Chassis Integration
Fully compatible with NXI-F1000 chassis for modular and scalable test architectures.
NET
Network-Based Control
LAN-based communication enables easy integration into existing IT and measurement systems.
DATA
Efficient Data Processing
The internal data memory reduces data loss and increases stability during high-speed measurements.
CTRL
Flexible System Control
Parameter adjustments and data analysis can be performed directly via network connections.
LAB
Ideal for Laboratory and Production
Suitable for development environments as well as industrial test benches in series production.

Strategic Value

The NXI-6100-32/12 combines high channel density, fast data acquisition, and flexible system integration in one compact module. This combination enables efficient analysis of complex electrical signals in modern test systems.

Thanks to the modular NXI platform, the system remains expandable at any time and provides long-term investment security for industrial measurement and test applications.

Consulting and Contact

Are you not sure whether this product is the best fit for your application? We are happy to support you in selecting the right solution for your requirements – from a standalone application to complete system integration.

Contact us conveniently via live chat, contact form, e-mail, or phone – we provide personal and practical advice.

Depending on availability, we can also provide a free demo unit for evaluation in your test environment so that you can test the system directly under real conditions.

Get in touch with us

+49 (0) 6205 - 3948-0 info@et-system.de

Mon - Thu: 8:00 AM - 5:00 PM
Fri: 8:00 AM - 3:00 PM

Contact Us Directly

+49 (0) 6205 - 3948-0 info@et-system.de

Mo - Do von 8 - 17 Uhr
Fr von 8 - 15 Uhr

Contact Us Directly