NXI-6100-32-12
NXI-6100 High-Speed DAQ Module
High-speed NXI DAQ module with 32 channels, 1.25 MS/s sampling, and ±10 V voltage.
The NXI-6100-32/12 is a high-speed data acquisition module featuring 32 analog input channels and 2 analog output channels. The analog inputs support voltage ranges of ±10 V, ±5 V, ±1 V, and ±200 mV, with the option to configure them as 16 differential inputs. With a total sampling rate of 1.25 MS/s for inputs and 1 MS/s for outputs, the module provides precise signal processing at 12-bit resolution. The integrated acquisition memory offers a capacity of 16 MB, while a 2048 KB cache is available for user-defined waveform outputs. Analog outputs deliver voltages up to ±10 V with a maximum current of 30 mA and a slew rate of 32 V/μs. The module is powered by 12 V DC and communicates via a LAN interface. Typical applications include electronic controller testing, industrial control systems, and research and education environments.
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Description
NXI-6100-32/12 High-speed data acquisition module, 32 AI, 2 AO, 12-bit, 1.25 MS/s input, 1 MS/s output
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Technical Data
NXI Category
Meas. & DAQ Modules
Product category
NXI Measurement & Test Systems
NXI-6100-32/12 – High-Speed Data Acquisition Module for Precise Multi-Channel Measurements
The NXI-6100-32/12 is a powerful high-speed data acquisition module for industrial test systems and research applications. With up to 32 analog input channels and a total sampling rate of 1.25 MS/s, the module enables highly accurate real-time monitoring of complex electrical signals.
The combination of high channel density, fast data acquisition, and integrated analog outputs makes the module ideal for modern test benches, automated test systems, and laboratory environments. Thanks to the modular NXI architecture, the system can be scaled flexibly and integrated easily into existing measurement and automation environments.
This creates a powerful platform for applications where high acquisition speed, precise signal resolution, and compact system integration are critical.
Key Advantages
Typical Applications
The NXI-6100-32/12 is suitable for industrial and scientific applications where many channels, high-speed sampling, and precise signal analysis are required at the same time.
High-speed testing of electronic assemblies and battery management systems.
Real-time monitoring and analysis of control and sensor signals in automated production environments.
Flexible signal acquisition and analysis for laboratory environments with changing measurement requirements.
Integration into modular ATE systems for precise data acquisition and signal processing.
Suitable for precise signal observation, transient analysis, and functional validation of electronic systems.
High channel count and fast data processing support standardized test procedures in production and quality assurance.
Functional Concept and System Architecture
The module supports both single-ended and differential measurements, making it flexible for a wide range of signal sources and EMC requirements.
Technical Key Data
Integration and Automation
The NXI-6100-32/12 was developed for integration into automated test systems and networked measurement environments. LAN-based communication simplifies remote control and integration into existing IT and test infrastructures.
Strategic Value
The NXI-6100-32/12 combines high channel density, fast data acquisition, and flexible system integration in one compact module. This combination enables efficient analysis of complex electrical signals in modern test systems.
Thanks to the modular NXI platform, the system remains expandable at any time and provides long-term investment security for industrial measurement and test applications.
Consulting and Contact
Are you not sure whether this product is the best fit for your application? We are happy to support you in selecting the right solution for your requirements – from a standalone application to complete system integration.
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Depending on availability, we can also provide a free demo unit for evaluation in your test environment so that you can test the system directly under real conditions.