NXI-5100

Resistance Module

Programmable 24-channel NXI resistance module for NTC simulation up to 60VDC.

The NXI-5100 is a high-density programmable resistance module available with 8, 12, 16, or 24 channels. Its programmable resistance range spans from a short circuit (0Ω) up to 11.11MΩ with a resolution of up to 1Ω. The module is rated for a maximum operating voltage of 60VDC or 125VAC and a maximum switching current of 0.5A. Each channel supports a maximum power dissipation of 0.25W. For advanced testing, it supports NTC short-circuit and open-circuit simulation. Measurement accuracy is specified at 0.1%+Rr for resistance values up to 2MΩ. Typical applications include BMS testing and the simulation of NTC temperature sensors or other resistive components. Designed for the NXI-F1000 chassis, it occupies a single slot and communicates via LAN using Modbus-RTU or SCPI protocols.

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Product variants

NXI-5100 – High-Density Programmable Resistor Module for BMS Testing and NTC Simulation

The NXI-5100 is a precise programmable resistor module for simulating resistive sensors in automated test environments. As a modular instrument for the NXI-F1000 chassis, it enables accurate reproduction of variable resistances from 0 Ω to 11.11 MΩ, providing a foundation for reproducible validation of modern control and monitoring systems.

With high channel density, fast switching, and precise resistance settings, the module is ideal for BMS tests, NTC simulations, and emulation of resistive sensors in research, development, and industrial quality assurance.

The modular NXI architecture supports space-saving, scalable, and future-proof integration into existing test systems.

Key Advantages for Quality Assurance

24CH

High Channel Density per Slot

With up to 24 channels per module, the NXI-5100 reduces space requirements in the test system and significantly lowers the cost per test point.

0.1%

High Simulation Accuracy

A base accuracy of 0.1% allows precise validation of SOC and SOH algorithms in battery management systems.

<1.1ms

Fast Switching Times

Short closing and opening times accelerate automated test sequences and improve throughput in test systems.

25ppm

High Temperature Stability

A temperature coefficient of 25 ppm/°C ensures reproducible test results even during long test cycles and changing environmental conditions.

NTC

Integrated Fault Simulation

Short-circuit and, depending on model, open-circuit simulations enable realistic stress testing for NTC and sensor circuits.

10⁸

Long Lifetime

More than 10⁸ switching cycles under low load ensure long-term reliability in continuous operation and reduce maintenance efforts.

Typical Applications

The NXI-5100 is especially suitable for test tasks requiring precise and reproducible simulation of variable resistances, temperature sensors, and fault scenarios.

BMS

BMS Testing

Simulation of cell voltage and temperature sensors to validate safety and monitoring functions in battery management systems.

NTC

NTC Temperature Simulation

Dynamic reproduction of temperature profiles to verify thermal management and protection logic.

SENS

Resistive Sensor Simulation

Precise emulation of variable resistance values for applications such as level, pressure, or temperature measurement.

ATE

Test Stand Integration

Used as a programmable replacement for classic decade resistors in automated ATE environments.

Technical Core Data

Resistance Range 0 Ω to 11.11 MΩ depending on model and configuration

Resolution up to 1 Ω, depending on model

Accuracy ≤ 2 MΩ 0.1% + Rr for precise sensor and BMS simulation

Accuracy > 2 MΩ 1% + Rr for high-resistance applications

Temperature Coefficient 25 ppm/°C for high long-term stability

Switching Times Close < 1.1 ms, Open < 0.4 ms

Max Operating Voltage 125 VAC / 60 VDC

Power Rating 0.25 W per channel

Interfaces LAN, SCPI, Modbus-RTU

Signal Output 68-Pin SCSI

Form Factor Single-slot module for NXI standard chassis

Residual Resistance Rr typically 3 Ω when programmed to 0 Ω

Function Concept and System Architecture

The NXI-5100 is designed for flexible integration into modular NXI test systems and supports precise resistance simulations in automated test processes.

NXI System Concept Designed for seamless integration into the NXI-F1000 chassis

Network-Based Control LAN connection for flexible integration into modern test architectures

SCPI & Modbus-RTU Standardized protocols for easy integration into existing software and ATE environments

Short-Circuit Simulation All models support 0 Ω simulation for realistic fault testing

Open-Circuit Simulation NXI-5100-600k and NXI-5100-6M additionally support open-circuit scenarios

Dynamic Resistance Adjustment Resistance values can be precisely changed during ongoing test processes

Variants and Configuration Options

The NXI-5100 is available in different channel variants, allowing flexible adaptation to the required integration level in the test system.

8 Channels Suitable for compact test setups with a small number of channels

12 Channels Good compromise for scalable tests with multiple simulation points

16 Channels For versatile test systems with higher integration density

24 Channels Maximum channel density per module for highly automated test environments

Model-Dependent Ranges Different resistance ranges for various sensor and NTC simulations

Fault Simulation Depending on model, with short-circuit and open-circuit functionality

Integration and Automation

The NXI-5100 is designed for use in automated test stands and multi-channel test systems.

LAN-based communication as well as SCPI and Modbus-RTU reduce integration effort and enable fast incorporation into custom ATE and software environments.

With high channel density, compact slot form factor, and robust design, the module is suitable both for R&D departments and 24/7 use in quality assurance.

Strategic Value

The NXI-5100 combines high channel density, precise resistance simulation, and robust industrial design in a compact module for modern test systems.

This enables complex BMS, NTC, and sensor validations with high reproducibility, low system complexity, and strong investment security.

Downloads

NXI-5100 – High-Density Programmable Resistor Module for BMS Testing and NTC Simulation

The NXI-5100 is a precise programmable resistor module for simulating resistive sensors in automated test environments. As a modular instrument for the NXI-F1000 chassis, it enables accurate reproduction of variable resistances from 0 Ω to 11.11 MΩ, providing a foundation for reproducible validation of modern control and monitoring systems.

With high channel density, fast switching, and precise resistance settings, the module is ideal for BMS tests, NTC simulations, and emulation of resistive sensors in research, development, and industrial quality assurance.

The modular NXI architecture supports space-saving, scalable, and future-proof integration into existing test systems.

Key Advantages for Quality Assurance

24CH

High Channel Density per Slot

With up to 24 channels per module, the NXI-5100 reduces space requirements in the test system and significantly lowers the cost per test point.

0.1%

High Simulation Accuracy

A base accuracy of 0.1% allows precise validation of SOC and SOH algorithms in battery management systems.

<1.1ms

Fast Switching Times

Short closing and opening times accelerate automated test sequences and improve throughput in test systems.

25ppm

High Temperature Stability

A temperature coefficient of 25 ppm/°C ensures reproducible test results even during long test cycles and changing environmental conditions.

NTC

Integrated Fault Simulation

Short-circuit and, depending on model, open-circuit simulations enable realistic stress testing for NTC and sensor circuits.

10⁸

Long Lifetime

More than 10⁸ switching cycles under low load ensure long-term reliability in continuous operation and reduce maintenance efforts.

Typical Applications

The NXI-5100 is especially suitable for test tasks requiring precise and reproducible simulation of variable resistances, temperature sensors, and fault scenarios.

BMS

BMS Testing

Simulation of cell voltage and temperature sensors to validate safety and monitoring functions in battery management systems.

NTC

NTC Temperature Simulation

Dynamic reproduction of temperature profiles to verify thermal management and protection logic.

SENS

Resistive Sensor Simulation

Precise emulation of variable resistance values for applications such as level, pressure, or temperature measurement.

ATE

Test Stand Integration

Used as a programmable replacement for classic decade resistors in automated ATE environments.

Technical Core Data

Resistance Range 0 Ω to 11.11 MΩ depending on model and configuration

Resolution up to 1 Ω, depending on model

Accuracy ≤ 2 MΩ 0.1% + Rr for precise sensor and BMS simulation

Accuracy > 2 MΩ 1% + Rr for high-resistance applications

Temperature Coefficient 25 ppm/°C for high long-term stability

Switching Times Close < 1.1 ms, Open < 0.4 ms

Max Operating Voltage 125 VAC / 60 VDC

Power Rating 0.25 W per channel

Interfaces LAN, SCPI, Modbus-RTU

Signal Output 68-Pin SCSI

Form Factor Single-slot module for NXI standard chassis

Residual Resistance Rr typically 3 Ω when programmed to 0 Ω

Function Concept and System Architecture

The NXI-5100 is designed for flexible integration into modular NXI test systems and supports precise resistance simulations in automated test processes.

NXI System Concept Designed for seamless integration into the NXI-F1000 chassis

Network-Based Control LAN connection for flexible integration into modern test architectures

SCPI & Modbus-RTU Standardized protocols for easy integration into existing software and ATE environments

Short-Circuit Simulation All models support 0 Ω simulation for realistic fault testing

Open-Circuit Simulation NXI-5100-600k and NXI-5100-6M additionally support open-circuit scenarios

Dynamic Resistance Adjustment Resistance values can be precisely changed during ongoing test processes

Variants and Configuration Options

The NXI-5100 is available in different channel variants, allowing flexible adaptation to the required integration level in the test system.

8 Channels Suitable for compact test setups with a small number of channels

12 Channels Good compromise for scalable tests with multiple simulation points

16 Channels For versatile test systems with higher integration density

24 Channels Maximum channel density per module for highly automated test environments

Model-Dependent Ranges Different resistance ranges for various sensor and NTC simulations

Fault Simulation Depending on model, with short-circuit and open-circuit functionality

Integration and Automation

The NXI-5100 is designed for use in automated test stands and multi-channel test systems.

LAN-based communication as well as SCPI and Modbus-RTU reduce integration effort and enable fast incorporation into custom ATE and software environments.

With high channel density, compact slot form factor, and robust design, the module is suitable both for R&D departments and 24/7 use in quality assurance.

Strategic Value

The NXI-5100 combines high channel density, precise resistance simulation, and robust industrial design in a compact module for modern test systems.

This enables complex BMS, NTC, and sensor validations with high reproducibility, low system complexity, and strong investment security.

Downloads "NXI-5100"

Download Datasheet - High Density Programmable Resistance Module - NXI-5100

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NXI-5100

Resistance Module

Personal project consultation

NXI-5100 – High-Density Programmable Resistor Module for BMS Testing and NTC Simulation

Key Advantages for Quality Assurance

Typical Applications

Technical Core Data

Function Concept and System Architecture

Variants and Configuration Options

Integration and Automation

Strategic Value

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NXI-5100 – High-Density Programmable Resistor Module for BMS Testing and NTC Simulation

Key Advantages for Quality Assurance

Typical Applications

Technical Core Data

Function Concept and System Architecture

Variants and Configuration Options

Integration and Automation

Strategic Value

Get in touch with us

NXI-5100

Resistance Module

Personal project consultation

Description

NXI-5100 – High-Density Programmable Resistor Module for BMS Testing and NTC Simulation

Key Advantages for Quality Assurance

Typical Applications

Technical Core Data

Function Concept and System Architecture

Variants and Configuration Options

Integration and Automation

Strategic Value

Product variants

Filter products

Technical Data

Technical Data

Technical Data

Technical Data

Technical Data

Technical Data

Technical Data

Technical Data

Technical Data

Technical Data

Technical Data

Technical Data

Technical Data

Technical Data

Technical Data

Technical Data

Technical Data

Technical Data

Technical Data

NXI-5100 – High-Density Programmable Resistor Module for BMS Testing and NTC Simulation

Key Advantages for Quality Assurance

Typical Applications

Technical Core Data

Function Concept and System Architecture

Variants and Configuration Options

Integration and Automation

Strategic Value

Get in touch with us

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