NXI-4501-4/32
32 x 4 Matrix Module
NXI-4501 Matrix module for signal switching up to 300V DC and 2A with 128 nodes.
The NXI-4501-4/32 is a matrix switch module featuring 128 nodes in a 1-wire 32x4 configuration. It supports voltages up to 250V AC or 300V DC with a maximum switching current of 2A. The module provides a maximum switching power of 60W or 62.5VA. With an action time of less than 3ms, it facilitates rapid signal routing in automated test environments. The switch bandwidth is specified at 10MHz or higher with 50Ω termination. A low initial DC path resistance of less than 0.5Ω ensures high signal integrity. Typical applications include data scanning acquisition, integrated test systems, and electronics production testing. This single-slot module is powered by 12V DC and utilizes LAN or CAN for communication.
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Description
NXI-4501-4/32 matrix switch module, 32×4 matrix, 2 A, 300 VDC/250 VAC, 60 W,
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Technical Data
NXI Category
Digital I/O modules
Product category
NXI Measurement & Test Systems
NXI-4501-4/32: High-Performance Matrix Switching Module for Automated Industrial Test Systems
The NXI-4501-4/32 is a powerful matrix switching module for flexible signal routing in modern automated test environments. With its 1-wire topology in a 32x4 configuration, the module enables software-controlled switching of up to 32 columns and 4 rows, for a total of 128 nodes.
This architecture replaces manual reconfigurations with precise, automated switching processes, significantly improving the efficiency of complex measurement setups. The module is designed for AC and DC applications in industrial environments and provides a robust foundation for modular test systems with high channel density.
Key User Benefits
Typical Applications
Fast switching and querying of multiple measurement points in complex test and monitoring systems.
Reliable signal distribution in serial production to support short cycle times and stable test processes.
Precise acquisition of electrical parameters at different nodes within a device under test.
Used as a central switching element in complex, software-controlled test benches and measurement networks.
