High output voltage
Three model ranges up to ±10,000 V support testing of insulation gaps, semiconductors and high-voltage components.
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Description
N3225-2.5K-M010 Programmable high-voltage DC power supply, 25 W, ±2500 V, 10 mA, 2U, LAN/RS232
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Current [A]
0,01
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Power [P]
25
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Voltage [V]
2500
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Product category
DC Power Supply
Type of DC source
Standard DC Source
High Voltage
Benchtop Unit
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Description
N3225-5K-M005 Programmable high-voltage DC power supply, 25 W, ±5000 V, 5 mA, 2U, LAN/RS232
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Current [A]
0,005
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Power [P]
25
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Voltage [V]
5000
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Product category
DC Power Supply
Type of DC source
Standard DC Source
High Voltage
Benchtop Unit
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Description
N3225-10K-M002 Programmable high-voltage DC power supply, 20 W, ±10000 V, 2 mA, 2U, LAN/RS232
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Current [A]
0,002
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Power [P]
20
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Voltage [V]
10000
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Product category
DC Power Supply
Type of DC source
Standard DC Source
High Voltage
Benchtop Unit
The N3200 series provides positive or negative DC voltage for tests requiring high voltage and low current. Three single-channel models cover ±2,500 V, ±5,000 V and ±10,000 V. Maximum output currents are 10 mA, 5 mA and 2 mA, with power ratings of 25 W, 25 W and 20 W respectively. Voltage and current can be controlled locally, through a 0 to 10 V analogue input or digitally via LAN and RS232. A programmable sweep generates stepped voltage profiles. Analogue monitor outputs represent voltage and current for external acquisition systems. The compact half-rack, 2U enclosure supports benchtop use and 19-inch installation with an optional mounting kit. Typical applications include breakdown, insulation, leakage-current, high-resistance material and high-voltage component testing.
Three model ranges up to ±10,000 V support testing of insulation gaps, semiconductors and high-voltage components.
Series-wide current resolution of 0.1 µA supports sensitive leakage-current and high-resistance material measurements.
Models up to 5 kV achieve no more than 3 mV RMS with the filter for low-noise measurement setups.
The output can be configured for positive or negative high voltage and adjusted down to 0 V.
The 214 mm wide enclosure occupies half of a 19-inch rack and is also suitable for benchtop operation.
A 2 ms communication response supports short control and query cycles in automated test systems.
The output operates as a programmable constant-voltage source with an adjustable current limit. Voltage and current are continuously read back and shown on the colour display. For tests requiring reverse polarity, the output direction can be changed while the output is disabled.
The setpoint is regulated within the selected positive or negative voltage range with an adjustable current limit.
Programmable protection values disable the output when the defined voltage or current threshold is exceeded.
Selectable output polarity removes the need for an external high-voltage reversing switch in the test setup.
The sweep increases voltage from the start to the end value using a programmable increment and time interval.
Output polarity may only be changed while the output is disabled. Switching polarity while high voltage is active is not permitted.
Model selection is based on maximum voltage, output current and output power. All three versions provide one output channel and separate positive and negative voltage ranges.
| Model | Output voltage | Output current | Output power | Channels |
|---|---|---|---|---|
| N3225-2.5K-M010 | ±2,500 V | 10 mA | 25 W | 1 |
| N3225-5K-M005 | ±5,000 V | 5 mA | 25 W | 1 |
| N3225-10K-M002 | ±10,000 V | 2 mA | 20 W | 1 |
| Specification | N3225-2.5K-M010 | N3225-5K-M005 | N3225-10K-M002 |
|---|---|---|---|
| Negative voltage range | −2,500 to 0 V | −5,000 to 0 V | −10,000 to 0 V |
| Positive voltage range | 0 to +2,500 V | 0 to +5,000 V | 0 to +10,000 V |
| Voltage programming resolution | 0.1 V | 0.1 V | 1 V |
| Current programming resolution | 0.1 µA | 0.1 µA | 0.1 µA |
| Voltage readback resolution | 0.1 V | 0.1 V | 1 V |
| Current readback resolution | 0.1 µA | 0.1 µA | 0.1 µA |
Programming and readback accuracy are specified separately for voltage and current. The models differ in output noise, while temperature coefficient and long-term stability are consistent across the series.
| Measurement specification | Series value |
|---|---|
| Voltage programming accuracy at 23 ± 5 °C | 0.01% + 0.05% of full scale |
| Current programming accuracy at 23 ± 5 °C | 0.02% + 0.05% of full scale |
| Voltage readback accuracy at 23 ± 5 °C | 0.01% + 0.05% of full scale |
| Current readback accuracy at 23 ± 5 °C | 0.02% + 0.05% of full scale |
| Programming and readback temperature coefficient | 50 ppm/°C |
| Long-term stability | ≤50 ppm/1,000 h |
| Voltage line regulation | ≤0.01% |
| Voltage load regulation | ≤0.01% |
| Model | Voltage ripple and noise with filter, 20 Hz to 20 MHz |
|---|---|
| N3225-2.5K-M010 | ≤15 mV peak-to-peak / ≤3 mV RMS |
| N3225-5K-M005 | ≤30 mV peak-to-peak / ≤3 mV RMS |
| N3225-10K-M002 | ≤50 mV peak-to-peak / ≤10 mV RMS |
Rise and fall times refer to a change between 10% and 90% of full scale or between 90% and 10%. The values depend on the model and load condition and must not be confused with the separately specified voltage settling time.
| Dynamic specification | N3225-2.5K-M010 | N3225-5K-M005 | N3225-10K-M002 |
|---|---|---|---|
| Voltage rise time, no load, 10 to 90% | ≤3 s | ≤4 s | ≤8 s |
| Voltage rise time, full load, 10 to 90% | ≤3 s | ≤4 s | ≤8 s |
| Voltage fall time, no load, 90 to 10% | ≤15 s | ≤30 s | ≤60 s |
| Voltage fall time, full load, 90 to 10% | ≤3 s | ≤3 s | ≤3 s |
| Voltage settling time | 3 s | 3 s | 3 s |
No-load voltage fall time increases significantly with the voltage range. Test timing should account for discharge of the connected DUT and the complete high-voltage setup.
| Function | Parameters | Practical use |
|---|---|---|
| Source mode | Output voltage, output current, voltage limit, current trip and polarity | Static high-voltage supply with defined protection and current limits. |
| Sweep mode | Start voltage, voltage increment, end voltage, time interval and current limit | Automated breakdown, insulation or characteristic testing with stepped voltage changes. |
| Single operation | One sequence from the start to the end value | Defined one-time voltage ramp for an individual test step. |
| Continuous operation | Repeated or continuous sweep procedure | Recurring stress profiles and extended stability tests. |
| Output reversal | Positive or negative output polarity | Testing a component or insulation system with both voltage polarities. |
| Data acquisition | Voltage and current recording with graphical display | Documentation and subsequent evaluation of high-voltage tests. |
High output voltage, low current, selectable polarity and low noise are suited to sensitive high-voltage and insulation measurements.
The source increases blocking voltage under control and measures current during breakdown and withstand testing of IGBTs and other high-voltage devices.
Defined positive or negative high voltage stresses insulation gaps, encapsulation materials and assemblies under repeatable conditions.
Current resolution of 0.1 µA supports acquisition of small leakage currents at high applied test voltage.
Low-noise high voltage supports measurement of high resistance and volume resistivity in materials and insulators.
Capacitors, sensors, connectors, cables and other high-voltage components can be tested using programmed voltages and sweep profiles.
Regulated high voltage supplies experimental systems requiring low current and traceable programming and readback values.
The N3200 series can be controlled locally, through analogue signals or digitally. Windows application software supports configuration, graphical measurement display, data recording, historical analysis and export.
| Interface or function | Implementation | Integration benefit |
|---|---|---|
| LAN | RJ45, default IP address 192.168.0.123 | Network-based remote control and integration into PC-controlled test systems. |
| RS232 | DB9 interface, default baud rate 115,200 baud | Serial communication with controllers and existing test systems. |
| SCPI | Remote commands for programmable instrument functions | Automated programming and measurement queries from customer-specific software. |
| GPIB | Optional through the separately available NE101 communication converter | Integration into existing IEEE-488 test systems. |
| Analogue voltage programming | 0 to 10 V, 1 MΩ input impedance, 0.2% of full scale, 16 Hz update rate | Direct output-voltage control from a PLC, DAQ system or analogue test controller. |
| Voltage monitor | 0 to 10 V, 1 Ω output impedance, 0.2% of full scale, 8 Hz update rate | Ground-referenced representation of the active output voltage for external acquisition. |
| Current monitor | 0 to 10 V, 1 Ω output impedance, 0.2% of full scale, 8 Hz update rate | Analogue representation of output current for measurement cards or monitoring systems. |
| PC software | Windows 7 or later, graphical display, data storage and export | Central operation, trend display and evaluation of recorded test values. |
| Communication response time | 2 ms | Short control and query cycles in automated procedures. |
| USB port | Front-panel connection for USB storage media | Local use of a storage device at the instrument. |
| Installation specification | Requirement or value |
|---|---|
| Form factor | Half 19-inch width, 2U |
| Dimensions | 88 × 214 × 413 mm |
| Net weight | Approx. 3 kg |
| Rack mounting | Optional 19-inch mounting kit available separately |
| AC input | 110 or 220 V AC ±10%, selector switch on the instrument |
| Line frequency | 47 to 63 Hz |
| Operating temperature | 0 to 40 °C |
| Storage temperature | −20 to 60 °C |
| Relative humidity | 5 to 90% RH, non-condensing |
| Operating altitude | Below 2,000 m |
| Atmospheric pressure | 80 to 110 kPa |
| Grounding | Reliable protective-earth and enclosure grounding are required. |
| Cooling | Air cooling; air inlets and outlets must remain unobstructed. |
| Function | Behaviour or rating |
|---|---|
| OVP | Overvoltage protection disables the output when the programmed voltage threshold is exceeded. |
| OCP or current trip | The output is disabled when the programmed current threshold is exceeded. |
| OTP | Overtemperature protection for instrument operation. |
| Output-to-ground isolation, N3225-2.5K-M010 | 2,500 V DC |
| Output-to-ground isolation, N3225-5K-M005 | 5,000 V DC |
| Output-to-ground isolation, N3225-10K-M002 | 10,000 V DC |
| Key lock | Front-panel controls can be locked against unintended local input. |
| Fault status | A triggered alarm can be cleared after the cause has been removed. |
| Protective earth | The instrument must be reliably grounded before operation. |
| Service access | The enclosure may only be opened by qualified personnel. |
Connections may only be changed while the instrument and output are disabled. Hazardous internal voltages may remain after switch-off. High-voltage testing requires qualified personnel, suitable protective measures and insulated tools.
The N3225-10K-M002 provides up to ±10,000 V, a maximum current of 2 mA and 20 W output power.
Yes. Output polarity is selectable. The output must be disabled before changing polarity.
Yes. All models provide separate negative and positive voltage ranges extending to 0 V.
Current programming and readback resolution are 0.1 µA for all three models.
Yes. Sweep mode programs start voltage, voltage increment, end voltage, time interval and current limit.
LAN and RS232 are standard and support remote control using SCPI commands.
The optional NE101 converter can be used to convert RS232 communication to GPIB.
Yes. A 0 to 10 V analogue signal controls the output from 0 V to the positive or negative full-scale value.
Are you planning a breakdown, insulation, leakage-current or material test and need to define the voltage range, current resolution, polarity, sweep procedure or automation concept?
ET System supports model selection, safe high-voltage integration, analogue or digital control and implementation in automated test systems.
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