Four-quadrant operation
The instruments source voltage or current and absorb power from the DUT in the opposing quadrants.
N2600 - High-precision source measure units up to 1,100 V
A compact platform for precise I-V characterization and automated component testing.
The 6½-digit measurement architecture combines voltage, current and resistance measurement in a single-channel half-rack instrument. Two-, four- and six-wire methods support both low-resistance devices and in-circuit resistance measurements where parallel paths would otherwise influence the result.
100 kS/s sampling
The maximum sampling rate supports timely acquisition of dynamic current and voltage behavior.
Programmable sweeps
Linear, logarithmic, custom and stored sequences automate characteristic I-V and resistance measurements.
Standardized integration
LAN, RS232 and SCPI are standard, while GPIB is available as an option.
Personal project consultation
Do you need support selecting the right power supply? Our technical specialists will provide personal advice tailored to your application.
Select the appropriate technical configuration or access product documentation directly.
ART. NO.
Description
N2600-020-01
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Description
N2600-020-01 – High-precision Source Measure Unit (SMU), four-quadrant operation, ±20 V, ±1 A, 20 W, 6½ digits
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SMU
N2600-200-01
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Description
N2600-200-01 – High-precision Source Measure Unit (SMU), four-quadrant operation, ±200 V, ±1 A, 20 W, 6½ digits
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SMU
N2600-1000-01
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Description
N2600-1000-01 – High-precision Source Measure Unit (SMU), four-quadrant operation, ±1,000 V, ±1 A, 20 W, 6½ digits
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SMU
N2610-100-03
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Description
N2610-100-03 – High-precision Source Measure Unit (SMU), four-quadrant operation, ±100 V, ±3 A, 100 W, pulse operation up to 10.5 A / 1,000 W, 6½ digits
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SMU
N2600 series overview
The N2600 series combines a programmable voltage source, current source, and voltage, current and resistance measurement in a compact SMU. Four models cover nominal ratings from 20 to 1,000 V, 1 to 3 A and 20 to 100 W. The N2610-100-03 extends operation with pulsed currents up to 10 A and 1,000 W pulse power. Every instrument provides one channel and four-quadrant operation, allowing it to power the DUT or absorb power from it. The 6½-digit readback, maximum sampling rate of 100 kS/s, and two-, four- or six-wire resistance measurement support electrical characterization of semiconductors, sensors, passive components, solar cells and electronic assemblies. The 2U half-rack enclosure suits both benchtop use and compact automated test systems.
Key benefits
Source and measurement combined
Voltage source, current source, and I, V and R measurement reduce instrument changes, wiring and bench space.
Fine readback resolution
Depending on the selected range, resolutions down to 1 µV, 10 pA and 10 µΩ are available.
Source and sink operation
Bidirectional current flow enables I-V curves across positive and negative voltage and current quadrants.
Flexible resistance measurement
Kelvin and six-wire methods reduce lead and parallel-path effects in demanding resistance measurements.
Fast data acquisition
Sampling at up to 100 kS/s supports dynamic analysis and short production test cycles.
Compact form factor
The half-rack format combines source, sink and measurement functions in one space-saving standalone instrument.
Operating principle
In the first and third quadrants, the SMU delivers electrical power to the device under test. In the second and fourth quadrants, current reverses: the DUT feeds current back into the instrument, which absorbs it passively and provides a return path. This arrangement supports source and sink measurements without rewiring.
Voltage or current can be programmed while the complementary quantity is measured simultaneously. The resulting data supports resistance calculations and complete I-V curves. Selectable ranges combine fine resolution with model-dependent high-voltage or high-current operating points.
Note on sink operation: The N2600 series absorbs power at its output but does not return this energy to the AC supply.
Models and operating envelopes
The four models primarily differ in voltage, current and power range. Within the respective power envelope, operating points can favor high voltage at reduced current or high current at reduced voltage.
| Model | Nominal specification | Source/sink envelope | Key distinction |
|---|---|---|---|
| N2600-020-01 | 20 V / 1 A / 20 W | ±21 V at ±1.05 A | Low-voltage model with fine measurement resolution |
| N2600-200-01 | 200 V / 1 A / 20 W | ±21 V at ±1.05 A ±210 V at ±105 mA |
Extended voltage range up to ±210 V |
| N2600-1000-01 | 1,000 V / 1 A / 20 W | ±21 V at ±1.05 A ±1,100 V at ±21 mA |
High-voltage model with a 1,100 V operating range |
| N2610-100-03 | 100 V / 3 A / 100 W 1,000 W pulse power |
±21 V at ±3.15 A ±105 V at ±1.05 A ±105 V at ±10.5 A in pulse mode |
Pulse range up to 10 A and 1,000 W |
The 10 A current measurement and output range, as well as pulse mode, are exclusive to the N2610-100-03. A maximum duty cycle of 8% applies to the 10 A range.
Dynamics and regulation
All models provide a maximum sampling rate of 100 kS/s and a transient response time of no more than 30 µs. Typical settling time depends on the model, selected range and test condition and must not be confused with slew rate.
| Model | Voltage slew rate | Current slew rate | Typical settling time |
|---|---|---|---|
| N2600-020-01 | 20 V: 0.08 V/µs ±20% | 1 A: 0.12 A/µs ±20% 100 mA: 0.008 A/µs ±20% |
Voltage: <20 to <195 µs Current: <10 µs to <5 ms |
| N2600-200-01 | 20 V: 0.08 V/µs ±20% 200 V: 0.5 V/µs ±20% |
1 A: 0.12 A/µs ±20% 100 mA: 0.008 A/µs ±20% |
Voltage: <20 to <375 µs Current: <10 µs to <5 ms |
| N2600-1000-01 | 20 V: 0.08 V/µs ±30% 1,000 V: 0.5 V/µs ±30% |
1 A: 0.1 A/µs ±20% 100 mA: 0.008 A/µs ±20% |
Voltage: <20 µs to <1.2 ms Current: <10 µs to <5 ms |
| N2610-100-03 | 20 V: 0.08 V/µs ±30% 100 V: 0.25 V/µs ±20% |
Not specified | Voltage: <20 to <375 µs Current: <20 to <375 µs |
Voltage settling times refer to a 10% to 90% change under open-circuit, no-load conditions. Current settling times refer to the same change with the output shorted.
Operating modes and programmable functions
Voltage and current source
Programmable voltage and current setpoints establish static operating points and characteristic measurements.
Four sweep methods
Linear, logarithmic, custom and built-in sweeps run once or continuously with a minimum step time of 1 ms.
Stored sequences
One hundred settings are stored in the system for direct use with the built-in sweep function.
N2610 pulse operation
The N2610-100-03 supports pulse widths from 150 µs, 10 µs programming resolution and up to 10 A output current.
Square-wave generator
The N2600-020-01, N2600-200-01 and N2600-1000-01 generate square waves at frequencies up to 5 kHz.
Trigger and measurement delay
External triggering, digital I/O and configurable measurement delay support repeatable automated sequences.
Typical applications
The combination of precise stimulus, readback and automated sweeps supports electrical characterization of individual components and complete electronic assemblies.
Semiconductors and power electronics
Diodes, Zener diodes, LEDs, laser diodes, BJTs, MOSFETs, and SiC and GaN devices are characterized across four quadrants.
Resistors and sensors
Two-, four- and six-wire measurements support resistors, thermistors, switches and photoelectric sensors.
Solar cells and materials
Programmable sweeps acquire I-V characteristics of solar cells, graphene, nanowires and printed electronics.
Energy efficiency and converters
Source-sink operation and simultaneous measurement support analysis of DC/DC converters, batteries and energy-efficient assemblies.
Production and end-of-line testing
Stored sequences, SCPI and fast readback reduce controller overhead and cycle time in automated systems.
Automotive and e-mobility
Sensors, switches and electronic assemblies can be validated with precise source and measurement functions.
Interfaces, software and automation
| Function | Availability | Purpose |
|---|---|---|
| LAN | Standard | Network-based remote control and test-system integration |
| RS232 | Standard | Serial instrument communication |
| SCPI | Standard | Automation through standardized remote commands |
| GPIB | Optional | Integration into established measurement and test environments |
| Digital I/O and Trigger Link | Standard | External sequence control and synchronization |
| Front USB | Standard | Storage of screen captures |
| PC application software | Included at no additional cost | Instrument control, data display and function calculations |
Installation and infrastructure
| Characteristic | N2600-020/-200/-1000 | N2610-100-03 |
|---|---|---|
| AC input | Single-phase, 110/220 V AC ±10%, 47 to 63 Hz | Single-phase, 110/220 V AC ±10%, 47 to 63 Hz |
| Enclosure | Half-rack, 2U | Half-rack, 2U |
| Dimensions H × W × D | 88 × 214 × 366 mm | 88 × 214 × 425 mm |
| Net weight | Approx. 3 kg | Approx. 3 kg |
| Operating temperature | 0 to 40 °C | 0 to 40 °C |
| Storage temperature | -20 to 60 °C | -20 to 60 °C |
| Relative humidity | 5 to 90% RH, non-condensing | 5 to 90% RH, non-condensing |
| Operating altitude | <2,000 m | <2,000 m |
| Common-mode voltage | 250 V DC | 125 V DC |
The AC input is switched between 110 and 220 V AC at the instrument. The voltage selector must match the available supply before connection.
Protection and safety functions
Overvoltage protection
A programmable voltage limit helps restrict stress on sensitive devices under test.
Overcurrent protection
Current protection supports defined limits during source and sink tests.
Overpower protection
Power monitoring protects the instrument and test setup from operating points outside the permitted envelope.
Overtemperature protection
Temperature monitoring responds to impermissible thermal operating conditions.
Frequently asked questions about the N2600 series
Which model is suitable for high-voltage measurements?
The N2600-1000-01 reaches up to ±1,100 V at a maximum of ±21 mA within its operating envelope.
Which model provides the highest current?
The N2610-100-03 provides 3 A in continuous operation and a 10 A range for pulsed measurements.
Can the series operate as an electronic load?
Yes. In the second and fourth quadrants, the SMU absorbs current from the DUT and operates as a sink.
Is absorbed energy returned to the AC supply?
No. Sink operation is non-regenerative; absorbed output power is not returned to the AC supply.
Which resistance measurement methods are supported?
All models support two-, four- and six-wire measurements for different resistance ranges and in-circuit situations.
Which interfaces are standard?
LAN, RS232, digital I/O, Trigger Link and front USB are standard. GPIB is optional.
Can the instruments automate characteristic sweeps?
Yes. Linear, logarithmic, custom and built-in sweeps support automated I-V, I-R, V-I and V-R characterization.
What is the minimum pulse width of the N2610-100-03?
The minimum pulse width is 150 µs with 10 µs programming resolution and ±5 µs accuracy.
Technical consultation and project enquiry
We support the selection of the required voltage, current and power range and integration into automated test systems.
- Model selection based on the required operating point
- Assessment of accuracy, dynamics and measurement method
- Coordination of interfaces and test sequences
