N23020
16 Channel DC Power Supply
Precise 16-channel DC supply N23020 for semiconductor tests up to 6V/1A
The N23020 series is an ultra-high precision, programmable multi-channel DC power supply engineered for the specific requirements of the semiconductor industry. It integrates up to 16 independent channels within a compact 19-inch 2U chassis, significantly reducing the space needed for large-scale testing. The device features a voltage range of 0 to 6 V with 0.1 mV precision and low ripple noise of ≤2 mVrms. For detailed analysis, it supports nA-level current measurement while providing output currents of up to 1 A per channel. A fast dynamic recovery time of less than 100 µs ensures stable power delivery without overshooting during rapid load changes. Users can customize sequences with up to 100 groups locally to facilitate automated testing procedures. Seamless system integration is supported via integrated LAN, RS485, and CAN interfaces, with the unit operating on a 220 V AC input. Typical applications include environmental reliability tests such as HTOL and HAST, as well as high-precision chip leakage current measurements.
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Description
N23020-06-01 Ultra-high accuracy 16-channel DC power supply, 6 V, 1 A, nA current measurement, 2U
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Current [A]
1
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Power [P]
6
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Voltage [V]
6
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Technical Data
Product category
DC Power Supply
Type of DC source
Standard DC Source
Multi-channel
High-Precision Multi-Channel DC Power Supply N23020 Series for Semiconductor Testing
The N23020 series is a programmable multi-channel DC power supply designed for high-precision semiconductor testing, reliability testing, and automated batch applications. With up to 16 channels in a compact 19-inch 2U chassis, the system combines high channel density, precise voltage regulation, and integrated current measurement for demanding test environments in development and quality assurance.
Its high setting accuracy of 0.1 mV, long-term stability over extended test periods, and near-nA current measurement capability make the series particularly suitable for HTOL, LTOL, ELFR, and leakage current testing. This makes the N23020 a scalable platform for precise, repeatable, and cost-efficient test processes in the semiconductor industry.
Key Benefits for Test Reliability
Typical Applications
Suitable for HTOL, LTOL, as well as ELFR and EFR procedures to determine failure rates and long-term behavior.
Supports accelerated aging tests such as HAST and THB under controlled temperature and humidity conditions.
Precise testing of chips and assembled circuit boards for detecting insulation faults and critical current paths.
Ideal for parallel test sequences with high repeatability and reduced wiring effort in ATE environments.
Function and System Description
Key Technical Data
| Parameter | N23020 Series | Comment |
|---|---|---|
| Voltage Range | 0–6 V | For precise semiconductor testing |
| Voltage Setting Accuracy | 0.001% + 0.1 mV | Resolution 0.01 mV |
| Current Ranges | 0–1 A and 0–1 mA | Two measurement and operating ranges |
| Current Measurement Accuracy 1 A | 0.001% + 0.5 mA | Resolution 0.01 mA |
| Current Measurement Accuracy 1 mA | 0.001% + 0.5 µA | Resolution 0.01 µA |
| Transient Recovery Time | < 100 µs | For load changes from 10% to 90% |
| Voltage Rise Time | ≤ 25 ms | At full load |
| Voltage Fall Time | ≤ 3 ms to ≤ 10 ms | No load or full load |
| Communication | LAN, RS485, CAN | For ATE and system integration |
| Form Factor | 19 inch / 2U | Compact multi-channel system |
| Cooling | Air-cooled | Front-to-rear airflow |
Variants and Configuration Options
The high integration density reduces rack space, wiring effort, and the complexity of parallel test setups.
Suitable for standard supply and load scenarios in semiconductor testing and reliability applications.
Supports highly precise leakage current and low-current analysis for sensitive DUTs.
Up to 100 groups of voltage and current sequences allow flexible test profiles without additional external hardware.
Integration and Automation
Strategic Added Value for Industrial Users
The N23020 series combines high integration density, precise voltage supply, and fine current measurement in one platform for modern semiconductor testing. This allows parallel test sequences to be scaled efficiently without compromising accuracy, stability, or operational safety.
Especially in long-duration reliability testing, climate chamber applications, and automated batch processes, users benefit from low drift, high signal purity, and reduced system complexity. This helps lower test costs and improve the quality of test results in development and production.
Consulting and Contact
Not sure whether this product is the right fit for your application? We are happy to support you in selecting the right solution for your requirements – from a single application to complete system integration. You can contact us conveniently via live chat, contact form, e-mail, or phone – we will advise you personally and practically. Depending on availability, we can also provide a free demo unit for evaluation in your test environment so that you can test the system directly under real conditions.
