Local sequence profiles
Voltage, current and step duration can be combined in up to 100 user-defined sequences.
N23010 – Programmable Multichannel DC Power Supply with up to 24 Channels
For parallel semiconductor reliability testing in environmental chambers and automated test systems.
The compact 19-inch enclosure integrates numerous isolated supply channels into a 3U instrument. Precise voltage regulation, low ripple and stable setpoints support extended test durations, while separate current ranges capture both operating current and small leakage currents.
Dual current ranges
An additional 1 mA range measures small currents with 0.1 µA resolution and 1 µA accuracy.
Fast load-step response
Voltage returns to the specified tolerance within less than 100 µs or 200 µs, depending on the model.
LAN, RS232 and CAN
Three standard interfaces support remote control and integration into automated semiconductor test systems.
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ART. NO.
Description
Current [A]
Power [P]
Voltage [V]
N23010-06-01
|
Description
N23010-06-01 Programmable high-accuracy multi-channel DC power supply, 6 V, 1 A, 3U, LAN/RS232/CAN
|
Current [A]
1
|
Power [P]
6
|
Voltage [V]
6
|
24 Channel DC source
Technical Data
Product category
DC Power Supply
Type of DC source
Standard DC Source
Multi-channel
N23010-06-03
|
Description
N23010-06-03 Programmable high-accuracy multi-channel DC power supply, 6 V, 3 A, 3U, LAN/RS232/CAN
|
Current [A]
3
|
Power [P]
18
|
Voltage [V]
6
|
24 Channel DC source
Technical Data
Product category
DC Power Supply
Type of DC source
Standard DC Source
Multi-channel
N23010-06-05
|
Description
N23010-06-05 Programmable high-accuracy multi-channel DC power supply, 6 V, 5 A, 3U, LAN/RS232/CAN
|
Current [A]
5
|
Power [P]
30
|
Voltage [V]
6
|
24 Channel DC source
Technical Data
Product category
DC Power Supply
Type of DC source
Standard DC Source
Multi-channel
N23010-15-01
|
Description
N23010-15-01 Programmable high-accuracy multi-channel DC power supply, 15 V, 1 A, 3U, LAN/RS232/CAN
|
Current [A]
1
|
Power [P]
15
|
Voltage [V]
15
|
24 Channel DC source
Technical Data
Product category
DC Power Supply
Type of DC source
Standard DC Source
Multi-channel
N23010 multichannel DC power supply overview
The N23010 series is designed for parallel power supply and monitoring of semiconductors, chips and populated test boards. Four models provide up to 6 V or 15 V per channel and current ratings of 1 A, 3 A or 5 A. In addition to the model-specific main current range, every channel provides a 0 to 1 mA range for small leakage and quiescent currents. Voltage programming resolution is 0.1 mV. Up to 24 channels are integrated into a 19-inch, 3U enclosure, allowing numerous devices under test to be powered simultaneously inside an environmental chamber. Local sequence programming, fast dynamic response and LAN, RS232 and CAN interfaces support automated long-term, reliability and production testing. Typical procedures include HTOL, LTOL, ELFR or EFR, HAST and THB.
Key benefits
High channel density
Up to 24 supply channels in 3U reduce instrument count, rack space and wiring effort in parallel chip testing.
Precise setpoint programming
Series-wide voltage resolution of 0.1 mV supports finely adjusted operating points for sensitive semiconductor circuits.
Leakage-current measurement
The separate low-current range captures small currents with 0.1 µA resolution and 1 µA accuracy.
Long-term voltage stability
Voltage stability of 80 ppm per 1,000 hours supports repeatable long-duration and reliability testing.
Fast voltage rise
The 6 V models reach the new operating point within no more than 20 µs at no load and resistive full load.
Isolated test channels
500 V DC channel-to-channel isolation supports separated test points and multichannel configurations.
Multichannel supply operating principle
Each channel operates as an independently programmable DC voltage source with individual current programming and measurement readback. Different supply points, devices or test boards can therefore be operated independently within one test configuration.
Regulated channel voltage
Each output provides a defined DC voltage within the selected model range and reads back the actual value.
Model-specific channel current
Depending on the model, 1 A, 3 A or 5 A per channel supports different chip and assembly loads.
Low-current range
The additional 0 to 1 mA range measures leakage, standby and quiescent currents independently of the main range.
Time-based power profiles
Programmable sequences change voltage and current according to defined step durations for repeatable stress profiles.
Models and technical specifications
Model selection is determined by the required channel voltage and maximum output current. All versions provide the same voltage resolution and an additional current range up to 1 mA.
| Model | Voltage range | Main current range | Low-current range |
|---|---|---|---|
| N23010-06-01 | 0 to 6 V | 0 to 1 A | 0 to 1 mA |
| N23010-06-03 | 0 to 6 V | 0 to 3 A | 0 to 1 mA |
| N23010-06-05 | 0 to 6 V | 0 to 5 A | 0 to 1 mA |
| N23010-15-01 | 0 to 15 V | 0 to 1 A | 0 to 1 mA |
| Voltage specification | 6 V models | N23010-15-01 |
|---|---|---|
| Programming resolution | 0.1 mV | 0.1 mV |
| Programming accuracy at 23 ± 5 °C | 0.6 mV | 1.5 mV |
| Readback resolution | 0.1 mV | 0.1 mV |
| Readback accuracy at 23 ± 5 °C | 0.6 mV | 1.5 mV |
| Voltage ripple and noise, 20 Hz to 20 MHz | ≤2 mV RMS | ≤5 mV RMS |
| Long-term stability | 80 ppm/1,000 h | 80 ppm/1,000 h |
| Temperature coefficient | 25 ppm/°C | 25 ppm/°C |
Current measurement and leakage-current acquisition
Each channel provides a model-specific main current range and a common low-current range. Operating current and small leakage current can therefore be measured within the same test configuration.
| Model | Main range | Resolution | Accuracy at 23 ± 5 °C |
|---|---|---|---|
| N23010-06-01 | 0 to 1 A | 0.1 mA | 1 mA |
| N23010-06-03 | 0 to 3 A | 0.1 mA | 3 mA |
| N23010-06-05 | 0 to 5 A | 0.1 mA | 5 mA |
| N23010-15-01 | 0 to 1 A | 0.1 mA | 1 mA |
| Low-current specification | Series value |
|---|---|
| Measurement range | 0 to 1 mA |
| Programming resolution | 0.1 µA |
| Programming accuracy at 23 ± 5 °C | 1 µA |
| Readback resolution | 0.1 µA |
| Readback accuracy at 23 ± 5 °C | 1 µA |
| Current long-term stability | 100 ppm/1,000 h |
| Current temperature coefficient | 30 ppm/°C |
Dynamic performance and regulation
Short voltage rise times support rapid setpoint changes. Load-step values refer to a change from 10% to 90% load at full output voltage. Recovery time ends when the voltage returns to within 50 mV of the previous value.
| Dynamic specification | 6 V models | N23010-15-01 |
|---|---|---|
| Voltage rise time, 10 to 90%, no load and resistive full load | ≤20 µs | ≤40 µs |
| Voltage fall time, no load, 90 to 10% | ≤3 ms | ≤6 ms |
| Voltage fall time, resistive full load, 90 to 10% | ≤100 µs | ≤200 µs |
| Transient voltage drop | 200 mV | 400 mV |
| Transient recovery time | <100 µs | <200 µs |
Rise and fall times apply at no load or resistive full load. Dynamic behaviour in an actual test circuit also depends on wiring, input capacitance and the device under test.
Programmable sequences and test procedures
Local sequence operation automates recurring supply steps without continuous manual setpoint changes. Output voltage, output current and running time are defined for each step.
Programmed voltage steps
Different supply voltages reproduce start-up conditions, stress phases and defined operating states of the device under test.
Individual current settings
The required output current can be configured for every sequence step and operating condition.
Defined step durations
A programmable running time determines how long voltage and current remain active during each sequence step.
Extensive profile storage
Up to 100 voltage and current sequences can be configured locally for repeatable test procedures.
Typical applications
High channel density, precise power delivery, long-term stability and leakage-current measurement are designed for parallel semiconductor testing.
High-Temperature Operating Life
Multiple chips are powered in parallel using stable, independently programmable voltages during long-term thermal stress.
Low-Temperature Operating Life
The channels provide repeatable operating points during extended semiconductor testing at low ambient temperatures.
Early-life-failure testing
Parallel stress testing of multiple devices supports early identification of failures and unstable samples.
Highly Accelerated Stress Test
The power supply operates with an environmental chamber during accelerated humidity, temperature and electrical stress testing.
Temperature Humidity Bias
Defined electrical bias is maintained while multiple devices are exposed to combined temperature and humidity stress.
Automated production and batch testing
Multiple channels power devices in parallel and support automated setpoint changes, operating-current and leakage-current measurement.
Interfaces and automation
Operation is available locally through the display, function buttons, numeric keypad and rotary control or remotely through the standard communication interfaces.
| Interface or function | Implementation | Integration benefit |
|---|---|---|
| LAN | Standard interface | Network-based remote control and integration into central test-system controllers. |
| RS232 | Standard interface | Serial communication with existing controllers and test systems. |
| CAN | Standard interface | Integration into CAN-based development, production and automation environments. |
| Local sequence editing | Up to 100 user-defined voltage and current sequences | Automated multistep testing without continuous manual setpoint changes. |
| Local operation | Display, function buttons, numeric keypad and rotary control | Direct configuration and monitoring of individual channels at the instrument. |
Installation and infrastructure
| Installation specification | Requirement or value |
|---|---|
| Form factor | 19-inch, 3U |
| Dimensions | 132.5 × 482 × 559 mm including handles |
| Net weight | Approx. 17 kg |
| AC input | Single-phase, 100 to 240 V AC, 47 to 63 Hz |
| Input current | ≤8 A at 220 V AC or ≤14 A at 110 V AC |
| Operating temperature | 0 to 40 °C |
| Storage temperature | −20 to 60 °C |
| Relative humidity | 5 to 90% RH, non-condensing |
| Operating altitude | Below 2,000 m |
| Atmospheric pressure | 80 to 110 kPa |
| Cooling | Air cooling; air inlets and outlets must remain unobstructed. |
Isolation and safe operation
| Specification | Rating or requirement |
|---|---|
| Output-to-ground isolation | 1,500 V DC |
| Channel-to-channel isolation | 500 V DC |
| Environment | Non-condensing operation within the specified temperature and humidity limits. |
| Ventilation | Air paths at the front, rear and enclosure must not be obstructed during operation. |
Integration with environmental chambers must account for wiring, channel separation, return-current paths and the permissible isolation ratings of the complete test setup.
N23010 series FAQ
Which model provides the highest channel current?
The N23010-06-05 provides up to 5 A per channel within a voltage range of 0 to 6 V.
Which model is suitable for voltages above 6 V?
The N23010-15-01 provides a voltage range of 0 to 15 V and a main current range up to 1 A.
Can small leakage currents be measured?
Yes. All versions provide an additional 0 to 1 mA range with 0.1 µA resolution and 1 µA accuracy.
How many channels are available in one instrument?
The series integrates up to 24 channels into a 19-inch, 3U enclosure.
Which sequence functions are available?
Output voltage, output current and running time can be stored in up to 100 locally configurable sequences.
Which interfaces are provided?
LAN, RS232 and CAN are standard and support integration into automated test systems.
Is the series suitable for long-term testing?
Yes. Voltage long-term stability is 80 ppm per 1,000 hours and supports procedures such as HTOL and LTOL.
Can the channels supply devices inside an environmental chamber?
The outputs can power test boards and semiconductors inside an environmental chamber while the instrument remains outside the chamber.
Technical consultation and project enquiry
Are you planning an HTOL, LTOL, HAST, THB or production test system and need to define channel count, voltage range, current measurement or automation?
ET System supports model selection, channel allocation, environmental-chamber integration and implementation in automated semiconductor test systems.
Request technical consultation
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