Up to 24 channels
High channel density supports the parallel supply of numerous chips and devices under test in one instrument.
N23010 – Multichannel DC Power Supply with up to 24 Channels
For parallel semiconductor reliability testing with isolated supply channels and precision leakage current measurement.
The N23010 series combines up to 24 programmable DC channels in a 19-inch 3U instrument. Four models cover 0 to 6 V or 0 to 15 V and combine 0.1 mV voltage resolution with current measurement down to the µA range.
Fine voltage resolution
Programming and readback operate with 0.1 mV resolution for precise supply settings.
µA current measurement
An additional 0 to 1 mA range enables measurement of small chip and assembly currents.
Automated test sequences
Up to 100 local sequence groups plus LAN, RS232 and CAN support repeatable test systems.
Personal project consultation
Do you need support selecting the right power supply? Our technical specialists will provide personal advice tailored to your application.
Select the appropriate technical configuration or access product documentation directly.
ART. NO.
Description
Current [A]
Power [P]
Voltage [V]
N23010-06-01
|
Description
N23010-06-01 Programmable high-accuracy multi-channel DC power supply, 6 V, 1 A, 3U, LAN/RS232/CAN
|
Current [A]
1
|
Power [P]
6
|
Voltage [V]
6
|
24 Channel DC source
Technical Data
Product category
DC Power Supply
Type of DC source
Standard DC Source
Multi-channel
N23010-06-03
|
Description
N23010-06-03 Programmable high-accuracy multi-channel DC power supply, 6 V, 3 A, 3U, LAN/RS232/CAN
|
Current [A]
3
|
Power [P]
18
|
Voltage [V]
6
|
24 Channel DC source
Technical Data
Product category
DC Power Supply
Type of DC source
Standard DC Source
Multi-channel
N23010-06-05
|
Description
N23010-06-05 Programmable high-accuracy multi-channel DC power supply, 6 V, 5 A, 3U, LAN/RS232/CAN
|
Current [A]
5
|
Power [P]
30
|
Voltage [V]
6
|
24 Channel DC source
Technical Data
Product category
DC Power Supply
Type of DC source
Standard DC Source
Multi-channel
N23010-15-01
|
Description
N23010-15-01 Programmable high-accuracy multi-channel DC power supply, 15 V, 1 A, 3U, LAN/RS232/CAN
|
Current [A]
1
|
Power [P]
15
|
Voltage [V]
15
|
24 Channel DC source
Technical Data
Product category
DC Power Supply
Type of DC source
Standard DC Source
Multi-channel
N23010 multi-channel DC power supply overview
The N23010 series is a high-precision programmable multi-channel DC power supply for semiconductor testing. It supplies chips and test boards during environmental and reliability tests and can be combined with an environmental test chamber. Up to 24 output channels are integrated in a 19-inch 3U enclosure. Four models provide either 0 to 6 V with up to 1 A, 3 A or 5 A, or 0 to 15 V with up to 1 A. Each model also includes a 0 to 1 mA current range for measurements down to the µA range. The series supports local operation, sequence programming and remote control via LAN, RS232 or CAN, making it suitable for parallel chip testing in R&D, sample evaluation and production testing.
Key benefits
High channel density
Up to 24 supply channels in 3U reduce rack-space requirements for parallel chip and assembly testing.
Precise voltage programming
0.1 mV programming and readback resolution supports finely stepped supply points across the respective voltage range.
Measure small currents
The 1 mA range provides 0.1 µA resolution and 1 µA programming and readback accuracy.
Long-term supply stability
Voltage stability of 80 ppm/1,000 h supports long reliability tests with repeatable supply conditions.
Fast transient recovery
The 6 V models recover from the specified load transient in under 100 µs; the 15 V model in under 200 µs.
Programmable sequences
Up to 100 locally configurable voltage and current sequence groups enable repeatable, time-controlled test procedures.
Operating principle and channel architecture
The N23010 provides programmable DC voltage and current limiting for multiple devices under test. Output voltage, output current and the run time of an individual sequence step can be defined. Up to 100 voltage and current sequence groups can be configured locally. LAN, RS232 and CAN are available for remote control in automated test systems.
Small-current measurement: In addition to its main current range, each model has a 0 to 1 mA range. This range provides 0.1 µA programming and readback resolution and 1 µA programming and readback accuracy at 23 ± 5 °C.
Models and output ranges
| Model | Voltage range | Current ranges | Voltage programming / readback resolution | Voltage programming / readback accuracy at 23 ± 5 °C | Ripple and noise, 20 Hz to 20 MHz |
|---|---|---|---|---|---|
| N23010-06-01 | 0 to 6 V | 0 to 1 A / 0 to 1 mA | 0.1 mV / 0.1 mV | 0.6 mV / 0.6 mV | ≤2 mVrms |
| N23010-06-03 | 0 to 6 V | 0 to 3 A / 0 to 1 mA | 0.1 mV / 0.1 mV | 0.6 mV / 0.6 mV | ≤2 mVrms |
| N23010-06-05 | 0 to 6 V | 0 to 5 A / 0 to 1 mA | 0.1 mV / 0.1 mV | 0.6 mV / 0.6 mV | ≤2 mVrms |
| N23010-15-01 | 0 to 15 V | 0 to 1 A / 0 to 1 mA | 0.1 mV / 0.1 mV | 1.5 mV / 1.5 mV | ≤5 mVrms |
Accuracy, stability and dynamic response
| Parameter | N23010-06-01 | N23010-06-03 | N23010-06-05 | N23010-15-01 |
|---|---|---|---|---|
| Main current range: programming / readback resolution | 0.1 mA / 0.1 mA | 0.1 mA / 0.1 mA | 0.1 mA / 0.1 mA | 0.1 mA / 0.1 mA |
| Main current range: programming / readback accuracy at 23 ± 5 °C | 1 mA / 1 mA | 3 mA / 3 mA | 5 mA / 5 mA | 1 mA / 1 mA |
| Voltage rise time, 10 to 90% | ≤20 µs | ≤20 µs | ≤20 µs | ≤40 µs |
| Voltage fall time, 90 to 10% | ≤3 ms at no load / ≤100 µs at purely resistive full load | ≤3 ms at no load / ≤100 µs at purely resistive full load | ≤3 ms at no load / ≤100 µs at purely resistive full load | ≤6 ms at no load / ≤200 µs at purely resistive full load |
| Transient voltage drop | 200 mV | 200 mV | 200 mV | 400 mV |
| Transient recovery time | <100 µs | <100 µs | <100 µs | <200 µs |
The rise times apply at no load and purely resistive full load. Voltage drop and recovery time refer to a load step from 10 to 90% at full output voltage; recovery time is measured until the voltage returns to within 50 mV of its previous value. Series-wide long-term stability is 80 ppm/1,000 h for voltage and 100 ppm/1,000 h for current. Temperature coefficients are 25 ppm/°C and 30 ppm/°C respectively.
Sequences and automation
| Function | Scope | Benefit in the test system |
|---|---|---|
| Local sequence editing | Output voltage, output current and run time per individual step; up to 100 sequence groups | Repeatable time-dependent supply profiles without manual setpoint changes |
| LAN | Remote control via network interface | Integration into automated networked test systems |
| RS232 | Serial remote control | Connection to existing control and test environments |
| CAN | Remote control via CAN interface | Integration into CAN-based test architectures |
Typical applications
HTOL and LTOL testing
Supplying multiple chips during extended reliability tests in combination with an environmental test chamber.
ELFR and EFR testing
Programmable multi-channel supply for ELFR and EFR procedures used in semiconductor testing.
HAST and THB testing
Stable DC supply for chips and test boards during HAST and THB reliability tests in combination with an environmental test chamber.
Leakage current measurement
The 1 mA range supports leakage current measurement on chips or connected test boards inside the environmental chamber.
Automated production testing
High channel density and LAN, RS232 or CAN enable integration into automated chip and batch test systems.
Installation and operating conditions
| Characteristic | Specification |
|---|---|
| AC input | Single-phase 100 to 240 V AC, 47 to 63 Hz; current ≤8 A at 220 V or ≤14 A at 110 V |
| Operating temperature | 0 to 40 °C |
| Storage temperature | -20 to 60 °C |
| Relative humidity | 5 to 90% RH, non-condensing |
| Altitude and atmospheric pressure | Below 2,000 m; 80 to 110 kPa |
| Isolation voltage | 1,500 V DC output to ground; 500 V DC between channels |
| Dimensions | 3U; 132.5 mm high × 482.0 mm wide including handle × 559.0 mm deep |
| Net weight | Approx. 17 kg |
Frequently asked questions about the N23010 series
How many channels does one N23010 instrument provide?
A single instrument integrates up to 24 supply channels in a 19-inch 3U enclosure.
Which voltage and current ranges are available?
The 6 V models provide main current ranges up to 1 A, 3 A or 5 A. The 15 V model provides up to 1 A. Every model also has a range up to 1 mA.
How finely can small currents be measured?
In the 0 to 1 mA range, readback resolution is 0.1 µA and readback accuracy is 1 µA at 23 ± 5 °C.
Can the power supply output time-dependent profiles?
Yes. Output voltage, output current and step duration can be defined, with up to 100 voltage and current sequence groups stored locally.
Which interfaces are available for automation?
LAN, RS232 and CAN are available for remote control.
Is the series intended for HTOL and LTOL testing?
Yes. The N23010 can supply multiple chips during HTOL and LTOL reliability tests and can be used with an environmental test chamber.
Does the N23010 support HAST and THB procedures?
Yes. HAST and THB are among the specified environmental and reliability tests for the series.
Can leakage current be measured during an environmental-chamber test?
Yes. The µA measurement range is intended for leakage-current measurement on chips or connected test boards inside the environmental chamber.
Technical consultation and project enquiry
We will be pleased to advise you on selecting the appropriate voltage and current range, the required channel count and integration into an environmental chamber and test automation. Send us your requirements for the device under test, sequence procedure, measurement range and interface.
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